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A novel triple-band high reflector design in sum-frequency-mixing yellow laser

S. L. HUANG1, N. CHEN1, Z. LIU1, Y. K. BU1,*

Affiliation

  1. Department of Electronic Engineering, Xiamen University, Xiamen, Fujian 361005, China

Abstract

A novel thickness modulation design solution based on modulation period is described for the design of triple-band high reflector in sum-frequency-mixing 593 nm yellow laser. The layer thicknesses of an arbitrary quarter-wave high reflector stack are modulated using cosine function. The relationship between modulation period and the position of stopband is analyzed. An analytical equation is derived that shows the spacing between the spectral centers of two adjacent stopbands as a function of modulation period. It is used to determine the modulation period in the triple-band high reflector design. The design of 593 nm/1064 nm/1342 nm triple-band high reflector in sum-frequency-mixing yellow laser is finished by this method. The only 32 layers laser high reflector is realized using TiO2/SiO2 materials. Central wavelength reflectivity is 99.899%, 99.947% and 99.864% at 1342 nm, 1064 nm and 593 nm, respectively.

Keywords

Sum-frequency-mixing, High reflector, Optical thin films.

Citation

S. L. HUANG, N. CHEN, Z. LIU, Y. K. BU, A novel triple-band high reflector design in sum-frequency-mixing yellow laser, Optoelectronics and Advanced Materials - Rapid Communications, 4, 10, October 2010, pp.1448-1452 (2010).

Submitted at: Aug. 25, 2010

Accepted at: Oct. 14, 2010