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R. ŞAHINGÖZ1,* , H. KANBUR ÇAVUŞ1, Ş. ALTINDAL2
Dielectric properties and ac electrical conductivity ( ) ac σ of Al/NphAOEMA/PEDOT-PSS/ITO structure were studied in the temperature range of 120-400 K. Experimental results show that dielectric constant (ε ') , dielectric loss (ε '') , dielectric loss tangent (tanδ ) and ac σ are strongly both temperature and bias voltage dependent. The values of ε ' are found to increase with increasing temperature while the values of ε '' decrease with increasing temperature for each bias voltage. Such behaviour of dielectric properties is dependent on the amount of interfacial polarization with temperature. In addition, we obtained the values of activation energy (Ea) from the Arrhenius plots for four different bias voltages. The high Ea that is observed in the low bias voltage may be due to the sum of the energies required for the generation of the charge carriers and their motion into vacancies.
Dielectric properties, Electrical conductivity, Temperature dependent, Polymer.
R. ŞAHINGÖZ, H. KANBUR ÇAVUŞ, Ş. ALTINDAL, AC electrical conductivity and dielectric properties of Al/NphAOEMA/PEDOT-PSS/ITO structure at different temperatures, Optoelectronics and Advanced Materials - Rapid Communications, 4, 11, November 2010, pp.1779-1782 (2010).
Submitted at: May 5, 2010
Accepted at: Nov. 10, 2010
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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