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DAVID ASAEL GUTIÉRREZ HERNÁNDEZ1,* , CARLOS PÉREZ LÓPEZ1, FERNANDO MENDOZA SANTOYO1
The measurement of a surface profile by using High Speed Electronic Speckle Pattern Interferometry (HS-ESPI) is presented. It is realized by the temporal phase shifting algorithm proposed by Carré. The HS-ESPI is configured to 4000 frames per second (fps). Traditionally, temporal phase shifting techniques employed piezoelectric components to retrieve the optical phase of the measured object. In this work the retrieved optical phase comes directly from the object itself which is under a vibration condition. The measurement is done without the need of any piezoelectric component, any electronic synchronization or any other external component..
ESPI, High Speed Interferometry, Vibrations.
DAVID ASAEL GUTIÉRREZ HERNÁNDEZ, CARLOS PÉREZ LÓPEZ, FERNANDO MENDOZA SANTOYO, Application of the carré algorithm and high speed interferometer technique for fast surface profile measuremen, Optoelectronics and Advanced Materials - Rapid Communications, 8, 3-4, March-April 2014, pp.185-191 (2014).
Submitted at: Oct. 28, 2013
Accepted at: March 13, 2014
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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