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Characterization of Titanium dioxide thin film fabricated using spin coating technique

UMA ULLAS PRADHAN1, S. K. NAVEEN KUMAR2,*

Affiliation

  1. Department of Electronics, Mount Carmel College, Bangalore
  2. Department of Electronics, University of Mysore, Hassan

Abstract

Titanium dioxide films have been deposited on glass substrates by Spin Coating process. The thin film samples have been characterized for its structural and optical using Scanning Electron Microscope (SEM), Energy – Dispersive X-Ray Spectroscopy (EDAX), Ultra Violet –Visible (UV-Vis) Spectrophotometer and X-ray Diffraction (XRD)..

Keywords

TiO2 thin film, Spin coating, Eg, SEM, EDAX.

Citation

UMA ULLAS PRADHAN, S. K. NAVEEN KUMAR, Characterization of Titanium dioxide thin film fabricated using spin coating technique, Optoelectronics and Advanced Materials - Rapid Communications, 5, 7, July 2011, pp.799-801 (2011).

Submitted at: June 25, 2011

Accepted at: July 25, 2011