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Comparison of the critical current density of YBCO films obtained by dc sputtering and pulsed laser deposition

I. IVAN1,* , L. MIU1, S. POPA1, D. MIU2, P. MELE3, K. MATSUMOTO3

Affiliation

  1. National Institute of Materials Physics, 77125 Bucharest-Magurele, P. O. Box MG-7, Romania
  2. National Institute of Laser, Plasma, and Radiation Physics, 77125 Bucharest-Magurele, P. O. Box MG-36, Romania
  3. Department of Materials Science and Engineering, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu 804-8550, Japan

Abstract

We measured the critical current density Jc of optimally doped YBa2Cu3O7 − δ thin films obtained by dc sputtering on (100) oriented SrTiO3 substrates and by pulsed laser deposition (PLD) on (100) oriented MgO substrates with SrTiO3 buffers. Jc at various temperatures T was determined from the magnetization curves registered with a vibrating sample magnetometer for an external magnetic field H (oriented along the c axis) up to 90 kOe. It was found that Jc of the films obtained by PLD usually overcomes the Jc values of the sputtered films in the whole investigated (H, T) domain.

Keywords

Critical current density, Magnetization curves, DC sputtering, Pulsed laser deposition.

Citation

I. IVAN, L. MIU, S. POPA, D. MIU, P. MELE, K. MATSUMOTO, Comparison of the critical current density of YBCO films obtained by dc sputtering and pulsed laser deposition, Optoelectronics and Advanced Materials - Rapid Communications, 4, 8, August 2010, pp.1243-1245 (2010).

Submitted at: March 9, 2010

Accepted at: Aug. 12, 2010