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Electronic structure and microwave dielectric properties of Al and N co-doped 3C-SiC

ZHIMIN LI1,* , ZI YANG1, CHUANGCHUANG HE1, MAOLIN ZHANG1, YUNXIA HUANG1, YUE HAO1

Affiliation

  1. School of Advanced Materials and Nanotechnology, Xidian University, Xi’an 710071, China

Abstract

The formation energy, electronic structure and complex permittivities of 3C-SiC with different Al and N codoping levels were studied by the first principles plane wave pseudo-potential method based on the density functional theory. Results showed that the incorporation of N into SiC lowered the formation energy of Al-doped SiC, and that the band gap of co-doped SiC increased with increasing Al level. Both real part ε′ and imaginary part ε″ of complex permittivities for co-doped SiC in the frequency range of 8.2-18GHz increased firstly, and then decreased as the level of Al increased, with the maximum values in ε′ and ε″ for Al3-N complex..

Keywords

3C-SiC, Codoping, Electronic structure, Dielectric property.

Citation

ZHIMIN LI, ZI YANG, CHUANGCHUANG HE, MAOLIN ZHANG, YUNXIA HUANG, YUE HAO, Electronic structure and microwave dielectric properties of Al and N co-doped 3C-SiC, Optoelectronics and Advanced Materials - Rapid Communications, 9, 11-12, November-December 2015, pp.1503-1507 (2015).

Submitted at: June 11, 2014

Accepted at: Oct. 28, 2015