Abstract
The analysis of electro-optical properties of 635 nm InGaP/InGaAlP resonant-cavity light-emitting diodes with AlGaAs mirrors is presented. We show that including the p-doped electron stop layer in both side of active layer improves the efficiency of such device due to increasing the electron capture efficiency in the quantum wells and decreasing the electrical field across the active layer. Theoretical analysis is proved by experimental work.
Keywords
Charge carrier processes, Modeling, Semiconductor materials, Quantum wells, Resonant cavity light emitting diodes.
Citation
V. V. LYSAK, C. Y. PARK, K. W. PARK, Y. T. LEE, High efficient 635 nm resonant-cavity light-emitting diodes with modified electron stopped layers, Optoelectronics and Advanced Materials - Rapid Communications, 4, 6, June 2010, pp.778-783 (2010).
Submitted at: Feb. 10, 2010
Accepted at: June 16, 2010