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Image charge method based analytic model for imaging evaluation of pixellated CdZnTe detector

MIAO LI1,* , SHALI XIAO1, XI WANG1, LING NIE1, YULIN CAO2, YUXIAO CHEN2, LIU QIANG ZHANG1

Affiliation

  1. Key Laboratory of Optoelectronic Technology and System Ministry of Education, Chongqing University , Chongqing , China
  2. Institude of Electronic Engineering, China Academy of Engineering Physics, Mianyang , China

Abstract

A novel analytic model which mainly considers the trapped carrier effect for the pixellated CdZnTe detector is obtained. The simulation results indicate that the rise of the photon energy reduce s the signal modulation transfer function of the CdZnTe crystal MTF CZT). Obvious decline of the MTF CZT w as also found only when the electron mobility lifetime product ( μ e τ e ) decreas es to the order 105 cm2 /V 106 cm2/V. The detailed analysis reveal s that the deteriorations of the MTF CZT, which resulted from the increas e of the photon energy and the decline of the μτ , mainly attribute to the de crease of the interaction probability and the aggravation of the carrier trapping effect. Moreover, a 40 × 40 mm 2 CdZnTe imaging system has been established. The comparison of the presampling MTF show s that the simulation result is well consistent with the xperimental data..

Keywords

CdZnTe, Image charge method, Irradiation detector, Induced charge.

Citation

MIAO LI, SHALI XIAO, XI WANG, LING NIE, YULIN CAO, YUXIAO CHEN, LIU QIANG ZHANG, Image charge method based analytic model for imaging evaluation of pixellated CdZnTe detector, Optoelectronics and Advanced Materials - Rapid Communications, 5, 6, June 2011, pp.621-626 (2011).

Submitted at: March 29, 2011

Accepted at: June 9, 2011