Abstract
InGaN/GaN light emitting diodes (LEDs) are gro
wn on Si(111) substrate by metal organic chemical vapor deposition(MOCVD)
in this paper. Ammonia NH 3 ) flow modulation on SiNx mask layer method was adopted to grow LED structures. Compared
with the LED grown by fixing ammonia flow, the sample grown by NH 3 flow modulation shows significant decrease in the full width at half maximum (Meanwhile, the device made by ammonia flow modulation method also shows higher
electroluminescence (EL) intensity and outpower. The low NH 3 flow in the initial growth sta ge can considerably increase the
GaN island density on the nano porous SiNx layer by enhancing vertical growth. Lateral growth is significantly favored by
high er ammonia flow in the subsequent step. This leads to extensive dislocation bending and annihilation, which is also
confirmed by transmission electronic microscopy (TEM) characterization. The results show adopting ammonia flow
modulation on SiNx mask layer is very promising to obtain high power LED on Si substrates..
Keywords
GaN epilayer, MOCVD, Ammonia flow modulation.
Citation
NAISEN YU, HAIYING DU, YONGQIANG ZHANG, BOYA HU, YAN CONG, YUNFENG WU, InGaN/GaN light emitting diodes grow on Si(111) substrates by ammonia flow modulation method, Optoelectronics and Advanced Materials - Rapid Communications, 7, 1-2, January-February 2013, pp.14-17 (2013).
Submitted at: March 17, 2012
Accepted at: Feb. 20, 2013