Abstract
In the current study, the electron beam (e-beam) evaporation deposition technique was utilized to examine the effect of annealing on the structural and electrical properties of In-doped CdTe/CdS thin-film solar cells. Thin-film solar cells were deposited onto the ITO-coated glass substrate with the e-beam technique. These solar cells were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray (EDS) analysis. The crystallite size, inter-planer distance, and lattice constant values were calculated for the thin-film solar cells using XRD data. The current–voltage (I–V) characteristics of the solar cells were examined by solar simulator..
Keywords
Thin-film solar cells, E-beam, In-doped CdTe, Structural properties, Electrical properties.
Citation
I. KIRBAS, R. KARABACAK, K. YILMAZ, D. TAKANOGLU, Investigation of electrical and structural properties of In-doped CdTe/CdS thin-film solar cells produced by E-beam techniques, Optoelectronics and Advanced Materials - Rapid Communications, 12, 7-8, July-August 2018, pp.413-416 (2018).
Submitted at: March 14, 2017
Accepted at: Aug. 9, 2018