Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.
M. KAVOSH TEHRANI1,* , R. TOFIGH MOVALU1
In this paper, the gradient index planar microlens profile shape made by ion exchange process is determined by the semi-circular interference pattern obtained from total shearing interferometric. In the following, the focal length and half the width of the wave was calculated with simulation of Gaussian beam propagation through this planar microlens by Optiwave software. It is worth mentioning that the simulation results are in good agreement with the experimental results obtained for the profile..
Beam width, Focal length, Gaussian beam, Graded-Index Planar Microlens.
M. KAVOSH TEHRANI, R. TOFIGH MOVALU, Measuring of the refractive index profile gradient index planar microlens by numerical method, Optoelectronics and Advanced Materials - Rapid Communications, 12, 11-12, November-December 2018, pp.660-664 (2018).
Submitted at: May 2, 2018
Accepted at: Nov. 29, 2018
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
Active accounts were imported to the new platform and assigned a random password by default. In order to access your account you need to access the login page and go through the Lost Password dialog (involves the system sending you an email with instructions) in order to reset your password. This step is necessary as passwords are kept in hashed form and the new platform uses modern hashing algorithms incompatible with the previous ones.