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İ. A. KARIPER1,*
In this paper, we explain the production of c hromium telluride (Cr 2 Te 3 ) crystalline thin film via chemical bath deposition on substrates (commercial glass). Properties of the thin film, such as transmittance, absorption, optical band gap and refractio n were examined in ultra violet Spectrum. The structural p roperties of orthorhombic form were observed through X ray diffraction. S tructural and optical properties of Cr 2 Te 3 thin films that were deposited at different pH levels were compared . Some properties of the films have changed with the change of pH, which has been deeply investigated. It has been observed that grain size of Cr 2 Te 3 thin film has reached its highest value at pH 9. The refraction indexes and extinction coefficients of Cr 2 Te 3 films deposited at various pH levels were calculated as 1.45, 1.82, 1.78, 1.40 (refraction index) 0.004, 0.010, 0.009, 0.003 (extinction coefficient), for amorphous structure with 24, 42 an d 63 nm average grain sizes at 550 nm wavelength) wavelength). The band gaps (Eg) of the films were measured as 2.06, 2.57, 2.04, and 2.76 eV for the grain sizes mentioned above..
Cr2Te3, Chemical Bath Deposition, Thin film.
İ. A. KARIPER, Optical and structural properties of chromium telluride (Cr2Te3) thin film produced via chemical bath deposition, Optoelectronics and Advanced Materials - Rapid Communications, 10, 7-8, July-August 2016, pp.541-546 (2016).
Submitted at: July 30, 2015
Accepted at: Aug. 3, 2016
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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