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Precise selection of focal length of manufacture graded-index planar microlens by simulation

M. KAVOSH TEHRANI1,* , R. TOFIGH MOVALU1

Affiliation

  1. Institute of Optics and Laser, Malek ashtar University of Technology, Shahin Shahr, Postal Code: 83145/115, Iran

Abstract

In this paper, for exact determination of focal length in graded-index planar microlens (GRIN PML) after manufacturing, the procedure is as follows: At first, propagation of Gaussian beam in single and stacked graded-index planar microlens was simulated by optiwave software. By using simulation data, the focal length and beam width in focal point were obtained. Simulations showed that there is a linear relation between focal length and length of substrate. As a result, by choosing the optimum length of substrate we managed to obtain the arbitrary focal length of GRIN PML. In addition, we showed that beam width and focal length of stacked GRIN PML were less than GRIN PML..

Keywords

Beam width, Focal length, Gaussian beam, Graded-Index Planar Microlens.

Citation

M. KAVOSH TEHRANI, R. TOFIGH MOVALU, Precise selection of focal length of manufacture graded-index planar microlens by simulation, Optoelectronics and Advanced Materials - Rapid Communications, 12, 5-6, May-June 2018, pp.275-278 (2018).

Submitted at: July 12, 2017

Accepted at: June 7, 2018