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D. LI1,* , B. LI1, S. XUE2
ZnO thin film has been successfully prepared on shape memory alloy (SMA) substrate by sol-gel method. The thin films are characterized by X-ray diffraction (XRD), photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and optical reflection. Results show that (002)-oriented polycrystalline film is deposited on the SMA substrate. The successful formation of ZnO films on SMA substrate implies that it may be possible to use the SMA transformation to adjust the electro-optical properties of the ZnO film.
ZnO thin film, Shape memory alloy substrate, Sol-gel method, XRD, PL.
D. LI, B. LI, S. XUE, Preparation and characterization of ZnO thin films on shape memory alloy substrates prepared by sol-gel method, Optoelectronics and Advanced Materials - Rapid Communications, 4, 10, October 2010, pp.1598-1600 (2010).
Submitted at: Sept. 6, 2010
Accepted at: Oct. 14, 2010
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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