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WAN MAISARAH MUKHTAR1,* , SAHBUDIN SHAARI1, P. SUSTHITHA MENON1
Surface Plasmon Resonance (SPR) spectroscopy is a surface-sensitive technique that has been extensively studied in sensing applications. For the optimization purpose of data collection, the SPR setup becomes more costly due to the employment of expensive optical apparatus. In this study, we proposed a modified optical waveguiding assembly to observe the plasmon mode coupling phenomenon. By employing the Kretschmann configuration, the effect of various thicknesses of silver thin films to the strength of SPR signal was investigated. The experimental results show an excellent agreement with the Fresnel equation from simulated results which verify the stability and the accuracy of our setup to observe the SPR phenomena. The optimum thickness of thin film for the excitation of strong SPR signal is 50 nm which results in minimum reflectance of 0.136 at a resonant angle of 56°. As the thicknesses increased to 70 nm and 90 nm, the SPR dip became shallower considering the absorption of surface plasmon polaritons in a silver layer. A good verification between both experimental and simulated results with small percentage difference of 0.90% proves the capability of our proposed modified optical waveguiding setup to be used in SPR experiments..
Optical waveguiding, Surface plasmon resonance, Thin film thickness, Silver, Low cost.
WAN MAISARAH MUKHTAR, SAHBUDIN SHAARI, P. SUSTHITHA MENON, Propagation of surface plasmon waves at metal thin film/air interface using modified optical waveguiding assembly, Optoelectronics and Advanced Materials - Rapid Communications, 7, 1-2, January-February 2013, pp.9-13 (2013).
Submitted at: Oct. 15, 2012
Accepted at: Feb. 20, 2013
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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