Abstract
Sulfur dioxide is one of the most abundant pollutants known in the world. It is emitted by antropic sources, especially due to the combustion of S containing fossil fuels, from both stationary and mobile sources. SO2 emissions produce heavy pollution over areas with noticeable adverse health effects, especially in gaseous form or through reaction with condensed vapors, forming the acid rain. Volcanoes are responsible for a large amount of SO2 natural degassing in the atmosphere, as well. Remote sensing measurement of pollution plume from distance is a new and challenging technique for air pollution monitoring. Thus stack emitted SO2 plumes may be monitored without relying on the cooperation of the industrial facilities that generate the pollution. The SO2 camera is a novel device developed using solar radiation scattered in the atmosphere as a light source for the measurements. The method is based on measuring the ultra-violet absorption of SO2 in a narrow wavelength window around 310 nm, by applying a band-pass interference filter and a two dimensional UV - sensitive charge coupled device (CCD) detector. The paper is focused on real results accomplished in parallel at a Romania power plant, by using an UV camera for SO2 emission, and the comparison with results obtained with a standard in stack measuring method. Based on the evaluation program developed using the measured values, the conclusion driven from the study is that the SO2 concentration data delivered by remote sensing using UV cameras are appropriate to be used for stack emission evaluations. Still for getting an optimal correlation between emissions measured with standard methods, in stack, and remote sensing by UV cameras, one has to multiply the results, thus enabling to perform better corrections factors for the mathematical model used..
Keywords
Ultraviolet (UV) camera, Remote sensing, Sulfur dioxide, Pollution, SO2 monitoring.
Citation
GH. C. NISULESCU, I. IONEL, F. POPESCU, Research concerning emissions monitoring by means of UV cameras, Optoelectronics and Advanced Materials - Rapid Communications, 6, 9-10, September-October 2012, pp.935-940 (2012).
Submitted at: June 5, 2012
Accepted at: Sept. 20, 2012