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Structural and optical properties of spin coated Cd1-x ZnxO thin films

S. DHANKHAR1, R. S. KUNDU1,* , N. KISHORE1, R. PUNIA1, A. K. SRIVASTAVA2, J. KUMAR2

Affiliation

  1. Thin film Laboratory, Department of Applied Physics, Guru Jambheshwar University of Science & Technology, Hisar-125001, Haryana, India
  2. Thin film laboratory, Materials Science Programme, Indian Institute of Technology, Kanpur-208016, U.P., India

Abstract

Thin films of CdO have been prepared by spin coating method on the glass substrates taking solution(s) of cadmium acetate dihydrate and /or zinc acetate dehydrate in 2-methoxyethanol and monoethanolamine, and subsequent annealing at 250-450oC for 2h in air. CdO thin films cast are polycrystalline in nature and exhibits f.c.c. (NaCl-type) structure with lattice-parameter decreasing and average grain size increasing with increase in sol molarity and film thickness (number of coatings),. Further, they exhibits (i) optical transmittance of 50-90% in wave length range of 900-600 nm, (ii) broad absorption in the interval 400-550 nm, (iii) decrease of energy band gap (Eg) with increase in the molarity, number of coating.The Cd1-xZnxO (x = 0 -1) thin films prepared similarly on the glass substrate with 15 coatings continue to correspond to f.c.c. (NaCl-type) structure with lattice parameter in the range (4.697- 4.703) ± 0.006 Ǻ up to x = 0.4, but exhibits wurtzite-type hexagonal structure of ZnO with lattice parameters a = 3.246± 0.003 Ǻ, c = 5.225± 0.007 Ǻ for x =1, and mixture of the two phases for 0.6 ≤ x <1. They display (i) improved optical transmittance of 60-95% (ii) shift in transition zone towards the higher energy (iii) increase in energy band gap (Eg) with increasing zinc content. The values of Eg lie in the range 2.42 – 3.28eV for x lying in the range 0 – 1..

Keywords

Cd-Zn-O, Thin film, Spin coated films.

Citation

S. DHANKHAR, R. S. KUNDU, N. KISHORE, R. PUNIA, A. K. SRIVASTAVA, J. KUMAR, Structural and optical properties of spin coated Cd1-x ZnxO thin films, Optoelectronics and Advanced Materials - Rapid Communications, 4, 7, July 2010, pp.955-959 (2010).

Submitted at: June 3, 2010

Accepted at: July 14, 2010