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T. MOHAN BABU1, B. K. REDDY1,* , N. MADHUSUDHANA RAO2, R. P. VIJAYALAKSHMI1, D. RAJA REDDY1, S. UTHANNA1
Zn1-xMnxSe Diluted magnetic semiconducting films with x = 0.00, 0.10, 0.15 and 0.20 were formed at 523 K on glass substrates by co-evaporation. X-ray diffraction studies revealed that the films were polycrystalline in nature with zinc blende structure with preferential orientation along (111). Optical transmittance studies indicated a nonlinear variation of band gap with ‘x’ exhibiting a downward bowing at lower concentrations. All the films showed photoluminescence with composition dependent intensities and emission wavelengths.
Diluted magnetic semiconductors, Zn1-xMnxSe thin films structural, Optical properties, Photoluminescence.
T. MOHAN BABU, B. K. REDDY, N. MADHUSUDHANA RAO, R. P. VIJAYALAKSHMI, D. RAJA REDDY, S. UTHANNA, Structural and optical properties of ZnxMn1-xSe (0≤x≤0.20) films, Optoelectronics and Advanced Materials - Rapid Communications, 4, 10, October 2010, pp.1612-1616 (2010).
Submitted at: June 16, 2010
Accepted at: Oct. 14, 2010
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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