Abstract
Highly crystalline thin layers of 2-aminoanthracene compound have been grown onto the glass substrate near
thermodynamic equilibrium using hot wall technique. These films have been studied for their structural, optical and electrical
properties. X-ray diffraction and atomic force microscopy investigations on these films indicate their crystalline nature. The
crystallinity of these films found to increase with increase in substrate temperature, whereas lattice strain decreases.
Analysis of the optical absorption measurements indicate that interband transition energies lies in the range of 3.88-3.92
eV. Photoluminescence measurements on these films show prominent green emission peak around 2.4 eV. Room
temperature conductivity of these films lies in the range of 1.17 × 10-6 - 1.22 × 10-6 Ω-1cm-1..
Keywords
Thin films, Organic semiconductor, Electrical properties, Structural and optical properties.
Citation
SUKHWINDER SINGH BRAR, A. MAHAJAN, R. K. BEDI, Structural, optical and electrical characterization of hot wall grown 2-aminoanthracene films, Optoelectronics and Advanced Materials - Rapid Communications, 5, 8, August 2011, pp.815-820 (2011).
Submitted at: May 2, 2011
Accepted at: Aug. 10, 2011