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I. BIBICU1,* , A. LŐRINCZI1, A. VELEA1, F. SAVA1, M. POPESCU1
Thin films samples of SnSe2 deposited by PLD and PED have been prepared and studied by XRD and Mössbauer spectroscopy. The films are crystalline with a major phase of SnSe2 and minor phase of amorphous SnSe2. An oxidation process lead to the appearance of a thin layer of SnO2 on the surface of the PLD samples.
SnSe2, Mössbauer measurements: transmission and backscattering method, XRD, PLD, PED.
I. BIBICU, A. LŐRINCZI, A. VELEA, F. SAVA, M. POPESCU, Structure and Mössbauer measurements on SnSe2 bulk and thin films, Optoelectronics and Advanced Materials - Rapid Communications, 4, 10, October 2010, pp.1568-1571 (2010).
Submitted at: Sept. 15, 2010
Accepted at: Oct. 14, 2010
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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