"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

The effect of annealing temperature on the structural and optical properties of In2Se3 thin films

D. NITHYAPRAKASH1,* , N. PUNITHAVENI2, J. CHANDRASEKARAN1

Affiliation

  1. R&D Department of Physics, Sri Ramakrishna Mission Vidyalaya college of Arts and Science, Coimbatore -641 020, Tamilnadu, India
  2. Department of Physics, Maharaja Institute of Technology, Coimbatore-641 407, Tamilnadu, India

Abstract

Thin films of In2Se3 were prepared by thermal evaporation. X-ray diffraction indicated that the as grown films were amorphous in nature and became polycrystalline γ- In2Se3 films after annealing. Optical properties of the films, investigated by using spectrophotometer transmittance spectra in the wavelength range 200-2500 nm. The increase in the value of Eg opt with annealed treatment is interpreted in terms of the density of states model as proposed by Mott and Davis..

Keywords

In2Se3 thin films, Annealing Temperature, Structural: optical properties, Vacuum evaporation.

Citation

D. NITHYAPRAKASH, N. PUNITHAVENI, J. CHANDRASEKARAN, The effect of annealing temperature on the structural and optical properties of In2Se3 thin films, Optoelectronics and Advanced Materials - Rapid Communications, 4, 3, March 2010, pp.357-360 (2010).

Submitted at: Jan. 29, 2010

Accepted at: March 12, 2010