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The effect of doping in different layers on 2DEG for ultrathin-barrier AlN/GaN heterostructures

J. M. Al ABBAS1,* , P. NARIN1, G. ATMACA1, E. KUTLU1, B. SARIKAVAK-LISESIVDIN1, S. B. LISESIVDIN1

Affiliation

  1. Gazi University, Faculty of Science, Department of Physics, 06500 Teknikokullar, Ankara, Turkey

Abstract

In this study, we have numerically investigated the two-dimensional electron gas (2DEG) carrier densities and electron probability densities of pseudomorphically grown ultrathin-barrier AlN/GaN heterostructures using self-consistent solutions of one-dimensional, non-linear Schrödinger–Poisson equations. In these calculations, we have focused on three different AlN/GaN heterostructures included fully undoped, the only Si-doped cap layer and the only Si-doped barrier layer. As a result of the calculations, it was found that doping of AlN barrier layer more effective than other cases on the 2DEG carrier density and the doping of GaN cap layer has not a significant effect on the 2DEG probability densities..

Keywords

GaN, AlN, Ultrathin Heterostructures, 2DEG.

Citation

J. M. Al ABBAS, P. NARIN, G. ATMACA, E. KUTLU, B. SARIKAVAK-LISESIVDIN, S. B. LISESIVDIN, The effect of doping in different layers on 2DEG for ultrathin-barrier AlN/GaN heterostructures, Optoelectronics and Advanced Materials - Rapid Communications, 11, 5-6, May-June 2017, pp.328-331 (2017).

Submitted at: June 15, 2016

Accepted at: June 7, 2017