Abstract
GaN-based materials received great deal of attention because of the potential applications for optoelectronic devices
operating in the whole visible spectral range and in electronic devices such as high temperature, high power, and high
frequency transistor. The III-nitrides form a continuous alloy system with direct band gap ranging from 6.2 eV (AlN) to 0.7
eV (InN) with 3.4 eV for GaN. Consequently, the growth and physics of GaN-based materials have attracted tremendous
scientific attention. This article reports the use of plasma-assisted molecular beam epitaxy (MBE) to grow AlN on (111) Si
substrate at 850 ºC under UHV conditions for 15, 30, and 45 minutes. The films were characterized by high-resolution x-ray
diffraction (HR-XRD) and micro-Raman spectroscopy. XRD phase analysis of (0002) plane of GaN exhibits two intense and
sharp peaks, namely Si(111) and AlN(0002) diffraction peaks, at 28.4° and 36.1° respectively. Micro-Raman results show
that all the allowed Raman modes of AlN and Si are visible.
Keywords
AlN, Plasma-assisted MBE, Thin films, Micro-Raman spectroscopy.
Citation
L. S. CHUAH, Z. HASSAN, H. ABU HASSAN, The growth of AlN thin films on Si (111) substrate by plasma-assisted molecular beam epitaxy, Optoelectronics and Advanced Materials - Rapid Communications, 2, 3, March 2008, pp.137-139 (2008).
Submitted at: Feb. 11, 2008
Accepted at: March 16, 2008