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T. BODENDORFER1,* , A. HEßKE1, C. SAX1, A. W. KOCH1
Speckle-Interferometry (SI) is a powerful tool for fast, robust and non-contact measurements of displacement, vibration, roughness or shape. One of the key components in SI is the light source. Typical light sources are gas lasers, which meet all requirements like high intensity, homogeneous beam profile, and high degree of coherence. Due to large size, temperature control and high costs these types of laser can often not be used as an illumination source in SI-systems. Next to standard edge-emitting diode lasers, vertical cavity surface emitting lasers (VCSEL) are a promising alternative light source in SI. In this work, standard edge-emitting lasers are compared to VCSELs regarding the applicability in interferometric applications..
Speckle, Speckle-Interferometry, VCSEL, Vertical cavity surface emitting laser.
T. BODENDORFER, A. HEßKE, C. SAX, A. W. KOCH, VCSEL in interferometry: a comparison to edge-emitting diode lasers regarding their applicability in speckleinterferometry, Optoelectronics and Advanced Materials - Rapid Communications, 6, 1-2, January-February 2012, pp.36-39 (2012).
Submitted at: June 10, 2011
Accepted at: Feb. 20, 2012
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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